Presidential Address. Nano- and micro-geochronology in Hadean and Archean zircons by atom-probe tomography and SIMS: New tools for old minerals

  title={Presidential Address. Nano- and micro-geochronology in Hadean and Archean zircons by atom-probe tomography and SIMS: New tools for old minerals},
  author={John W. Valley and David A. Reinhard and Aaron J. Cavosie and Takayuki Ushikubo and D. F. Lawrence and David J. Larson and Thomas F. Kelly and David R. Snoeyenbos and Ariel Strickland},
  journal={American Mineralogist},
  pages={1355 - 1377}
Abstract Atom-probe tomography (APT) and secondary ion mass spectrometry (SIMS) provide complementary in situ element and isotope data in minerals such as zircon. SIMS measures isotope ratios and trace elements from 1-20 μm spots with excellent accuracy and precision. APT identifies mass/ charge and three-dimensional position of individual atoms (±0.3 nm) in 100 nm-scale samples, volumes up to one million times smaller than SIMS. APT data provide unique information for understanding element and… Expand
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