Preparation of ultra-thin oxide windows on titanium for TEM analysis.

@article{Rdegran1991PreparationOU,
  title={Preparation of ultra-thin oxide windows on titanium for TEM analysis.},
  author={G{\"o}ran R{\aa}degran and Jukka Lausmaa and Lars Mattsson and Ulf Rolander and Bengt Herbert Kasemo},
  journal={Journal of electron microscopy technique},
  year={1991},
  volume={19 1},
  pages={
          99-106
        }
}
Using submerged jet electropolishing, extremely thin (less than 10 nm), continuous, thermal oxide "windows" have been prepared on polycrystalline titanium (Ti). The preparation technique is described in detail. It has allowed a systematic investigation of the structure of thermal surface oxide layers on Ti in the thickness range 6-40 nm, corresponding to oxidation temperatures 100-450 degrees C. Auger electron spectroscopy was used for oxide characterization and for depth profiling to determine… CONTINUE READING

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