Preparation of Ag5−xTe3Thin Films and Confirmation of Their Crystal Structure by High Resolution Electron Microscopy

@article{Kalin1996PreparationOA,
  title={Preparation of Ag5−xTe3Thin Films and Confirmation of Their Crystal Structure by High Resolution Electron Microscopy},
  author={W. Kälin and J. Guenter},
  journal={IEEE Journal of Solid-state Circuits},
  year={1996},
  volume={123},
  pages={391-397}
}
  • W. Kälin, J. Guenter
  • Published 1996
  • Chemistry
  • IEEE Journal of Solid-state Circuits
  • Abstract Single crystalline thin films of Ag 5− x Te 3 (Steutzite) have been prepared from thin silver films and tellurium vapour and their crystal structure is compared to crystal structures formerly determined by various authors using X-ray and electron diffraction. The occurrence of one of these structures in our films is confirmed by means of electron diffraction and high resolution electron microscopy with image simulation, whereas others could be rejected. These thin films crystallize in… CONTINUE READING
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