Prediction of Future Failures for Heterogeneous Reliability Field Data

  title={Prediction of Future Failures for Heterogeneous Reliability Field Data},
  author={Colin Lewis-Beck and Qinglong Tian and William Q. Meeker},
  pages={125 - 138}
Abstract This article introduces methods for constructing prediction bounds or intervals for the number of future failures from heterogeneous reliability field data. We focus on within-sample prediction where early data from a failure-time process is used to predict future failures from the same process. Early data from high-reliability products, however, often have limited information due to some combination of small sample sizes, censoring, and truncation. In such cases, we use a Bayesian… 

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