Practical fault coverage of supply current tests for bipolar ICs

Abstract

Bipolar logic circuits are indispensable for implementing high-speed logic circuits. Since quiescent supply current flows into the circuits without faults, they can not be tested by a conventional IDDQ test method. We proposed a quiescent supply current test method which is applicable for the bipolar circuit tests, and examined the testability of open… (More)
DOI: 10.1109/DELTA.2004.10035

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