Power Droop Testing

@article{Polian2006PowerDT,
  title={Power Droop Testing},
  author={Ilia Polian and Alexander Czutro and Sandip Kundu and Bernd Becker},
  journal={2006 International Conference on Computer Design},
  year={2006},
  pages={243-250}
}
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power droop and is an instance of power supply noise. Although power droop may cause an IC to fail, such failures cannot currently be screened during testing as it is not covered by conventional fault models. In this paper we present a technique for screening such failures. We propose a heuristic method to generate test… CONTINUE READING

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