Power Cycling Test Methods for Reliability Assessment of Power Device Modules in Respect to Temperature Stress

@article{Choi2018PowerCT,
  title={Power Cycling Test Methods for Reliability Assessment of Power Device Modules in Respect to Temperature Stress},
  author={Ui-Min Choi and Frede Blaabjerg and Sx00F8ren Jx00F8rgensen},
  journal={IEEE Transactions on Power Electronics},
  year={2018},
  volume={33},
  pages={2531-2551}
}
Power cycling test is one of the important tasks to investigate the reliability performance of power device modules in respect to temperature stress. From this, it is able to predict the lifetime of a component in power converters. In this paper, representative power cycling test circuits, measurement circuits of wear-out failure indicators as well as measurement strategies for different power cycling test circuits are discussed in order to provide the current state of knowledge of this topic… CONTINUE READING

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Semiconductor Power Device—Physics, Characteristic, Reliability

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