Power Constrained and Defect-Probability Driven SoC Test Scheduling with Test Set Partitioning

Abstract

This paper presents a test scheduling approach for system-on-chip production tests with peak-power constraints. An abort-on-first-fail test approach is assumed, whereby the test is terminated as soon as the first fault is detected. Defect probabilities of individual cores are used to guide the test scheduling and the peak-power constraint is considered in… (More)

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Cite this paper

@article{He2006PowerCA, title={Power Constrained and Defect-Probability Driven SoC Test Scheduling with Test Set Partitioning}, author={Zhiyuan He and Zebo Peng and Petru Eles}, journal={Proceedings of the Design Automation & Test in Europe Conference}, year={2006}, volume={1}, pages={1-6} }