Potential of ultra-high voltage silicon carbide semiconductor devices

Abstract

In this paper, the theoretical performance of ultra-high voltage Silicon Carbide (SiC) based devices are investigated. The SiC semiconductor device conduction power loss and switching power loss are predicted and compared with different modeling approaches, for SiC metal-oxide semiconductor field-effect transistors (MOSFETs) up to 20 kV and SiC gate turn… (More)

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