Posterior Distribution Charts: A Bayesian Approach for Graphically Exploring a Process Mean

  title={Posterior Distribution Charts: A Bayesian Approach for Graphically Exploring a Process Mean},
  author={Daniel W. Apley},
  pages={279 - 293}
  • D. Apley
  • Published 23 May 2012
  • Mathematics
  • Technometrics
We develop a Bayesian approach for monitoring and graphically exploring a process mean and informing decisions related to process adjustment. We assume a rather general model, in which the observations are represented as a process mean plus a random error term. In contrast to previous work on Bayesian methods for monitoring a mean, we allow any Markov model for the mean. This includes a mean that wanders slowly, that is constant over periods of time with occasional random jumps or combinations… 

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