Post-issue Patent “ Quality Control ” : a Comparative Study of Us Patent Re-examinations and European Patent Oppositions

  title={Post-issue Patent “ Quality Control ” : a Comparative Study of Us Patent Re-examinations and European Patent Oppositions},
  author={Stuart J. H. Graham and Bronwyn H. Hall and Dietmar Harhoff and David C. Mowery},
We report the results of the first comparative study of the determinants and effects of patent oppositions in Europe and of re-examinations on corresponding patents issued in the United States. The analysis is based on a dataset consisting of matched EPO and US patents. Our analysis focuses on two broad technology categories biotechnology and pharmaceuticals, and semiconductors and computer software. Within these fields, we collect data on all EPO patents for which oppositions were filed at the… CONTINUE READING
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