Post-Silicon Design Methodology on Chip Power Characterization, Validation, and Debug Applied on High Performance Per Watt Microprocessor

@article{Chen2007PostSiliconDM,
  title={Post-Silicon Design Methodology on Chip Power Characterization, Validation, and Debug Applied on High Performance Per Watt Microprocessor},
  author={Y.-C.S. Chen and Daniel L. Lu and Gang Yuan},
  journal={2007 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)},
  year={2007},
  pages={1-4}
}
As performance per Watt concept being adapted on CPU's performance, a comprehensive post-silicon design methodology on chip power characterization, debug, and validation developed for an energy-efficient product performance become ever more important. An infrared photon-emission (IREM) based technique has been established to meet the needs. With those developed tool capabilities, we can validate simulated fullchip power, determine the causes of excessive power leakage, generate die power and… CONTINUE READING

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