Portable parallel test generation for sequential circuits

@article{Ramkumar1992PortablePT,
  title={Portable parallel test generation for sequential circuits},
  author={Balkrishna Ramkumar and Prithviraj Banerjee},
  journal={1992 IEEE/ACM International Conference on Computer-Aided Design},
  year={1992},
  pages={220-223}
}
A parallel test generation algorithm, ProperTEST, for sequential circuits that is portable across a range of MIMD parallel architectures is discussed. It uses prioritized execution to ensure consistent speedups as the number of processors is increased. This consistency is achieved without loss of fault coverage with increase in the number of processors. This also permits the use of parallel processing to improve the fault coverage when the execution time is bounded. Results on ISCAS 89… CONTINUE READING

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