Porosity and mechanical properties of mesoporous thin films assessed by environmental ellipsometric porosimetry.

@article{Boissire2005PorosityAM,
  title={Porosity and mechanical properties of mesoporous thin films assessed by environmental ellipsometric porosimetry.},
  author={C{\'e}dric Boissi{\`e}re and David Grosso and Sophie Lepoutre and Lionel Nicole and Aline Brunet Bruneau and Cl{\'e}ment A Sanchez},
  journal={Langmuir : the ACS journal of surfaces and colloids},
  year={2005},
  volume={21 26},
  pages={12362-71}
}
Mesoordered silica thin films with cubic structures were prepared by evaporation induced self-assembly (EISA) with two types of structuring agent (CTAB and block copolymer F127). A complete and accurate description of these films was obtained by combining 2D-SAXS analyses, variable angle spectroscopic ellipsometry, and a specially designed environmental ellipsometric porosimetry (EEP) experiment. The EEP analysis is rapid and cheap and operates at ambient pressure and temperature. This latter… CONTINUE READING
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