Pomiary rezystancji termicznej tranzystorów mocy z wykorzystaniem metod pirometrycznych
@inproceedings{Grecki2003PomiaryRT, title={Pomiary rezystancji termicznej tranzystor{\'o}w mocy z wykorzystaniem metod pirometrycznych}, author={Krzysztof G{\'o}recki and Janusz Zarębski}, year={2003} }
No Paper Link Available
10 Citations
Wpływ dodatków organicznych na właściwości fizykochemiczne polimerowych past termoprzewodzących do zastosowania w elektronice
- Materials Science
- 2017
Measurements of thermal resistance of power LEDs
- Physics
- 2014
Purpose – The purpose of this paper is to present a new method of measuring thermal resistance of power light-emitting diodes (LEDs). Properties of power LEDs strongly depend on their internal…
System pomiarowy do wyznaczania parametrów termicznych elementów półprzewodnikowych
- Materials Science
- 2013
Measuring system for determining thermal parameters of semiconductor devices
- Engineering, Materials ScienceProceedings of the 20th International Conference Mixed Design of Integrated Circuits and Systems - MIXDES 2013
- 2013
The measuring system, elaborated by the authors, for determining thermal parameters of semiconductor devices with the use of electrical methods, is presented and a sample circuit solution dedicated for measurements of diodes is described.
The dc measurement method of thermal resistance of IGBTs
- Engineering, PhysicsProceedings of the 20th International Conference Mixed Design of Integrated Circuits and Systems - MIXDES 2013
- 2013
In the paper the dc measurement method of thermal resistance of the IGBT is presented. The possibilities of selection of a thermally sensitive parameter and a manner of realization of the method are…
DC measurements method of the thermal resistance of power MOSFETs
- EngineeringProceedings of the 19th International Conference Mixed Design of Integrated Circuits and Systems - MIXDES 2012
- 2012
The conception of this method of thermal resistance of power MOS transistors and the way of its realization are presented and the discussion on the influence of selected factors on the accuracy of the elaborated method is included.