• Corpus ID: 136399851

Pomiary rezystancji termicznej tranzystorów mocy z wykorzystaniem metod pirometrycznych

@inproceedings{Grecki2003PomiaryRT,
  title={Pomiary rezystancji termicznej tranzystor{\'o}w mocy z wykorzystaniem metod pirometrycznych},
  author={Krzysztof G{\'o}recki and Janusz Zarębski},
  year={2003}
}

Measurements of thermal resistance of power LEDs

Purpose – The purpose of this paper is to present a new method of measuring thermal resistance of power light-emitting diodes (LEDs). Properties of power LEDs strongly depend on their internal

Measuring system for determining thermal parameters of semiconductor devices

  • J. ZarebskiK. GóreckiJ. Dąbrowski
  • Engineering, Materials Science
    Proceedings of the 20th International Conference Mixed Design of Integrated Circuits and Systems - MIXDES 2013
  • 2013
The measuring system, elaborated by the authors, for determining thermal parameters of semiconductor devices with the use of electrical methods, is presented and a sample circuit solution dedicated for measurements of diodes is described.

The dc measurement method of thermal resistance of IGBTs

  • K. GóreckiP. Górecki
  • Engineering, Physics
    Proceedings of the 20th International Conference Mixed Design of Integrated Circuits and Systems - MIXDES 2013
  • 2013
In the paper the dc measurement method of thermal resistance of the IGBT is presented. The possibilities of selection of a thermally sensitive parameter and a manner of realization of the method are

DC measurements method of the thermal resistance of power MOSFETs

  • K. GóreckiJ. Zarebski
  • Engineering
    Proceedings of the 19th International Conference Mixed Design of Integrated Circuits and Systems - MIXDES 2012
  • 2012
The conception of this method of thermal resistance of power MOS transistors and the way of its realization are presented and the discussion on the influence of selected factors on the accuracy of the elaborated method is included.