Polarization effects in Non-Contact Atomic Force Microscopy: a key to model the tip-sample interaction above charged adatoms

Abstract

We discuss the influence of short-range electrostatic forces, so called dipolar forces, between the tip of an atomic force microscope (AFM) and a surface carrying charged adatoms. Dipolar forces are of microscopic character and have their origin in the polarizability of the foremost atoms on tip and surface. In most experiments performed by non-contact AFM… (More)

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