Plenary Speech 2P1: Consumerization of Electronics and Nanometer Technologies: Implications for Manufacturing Test

  • Sanjiv Taneja
  • Published 2008 in
    9th International Symposium on Quality Electronic…

Abstract

Summary form only given. Test has long been recognized as the bridge between design and manufacturing. However, innovation and deep integration in design and test tools has not kept pace with the consumerization of electronics and the rapidly evolving nanometer IC design and manufacturing. As a result, the full potential of Test has not been harnessed by… (More)
DOI: 10.1109/ISQED.2008.178

Topics

Figures and Tables

Sorry, we couldn't extract any figures or tables for this paper.

Slides referencing similar topics