Planning and placing power clamps for effective CDM protection

  title={Planning and placing power clamps for effective CDM protection},
  author={Hsin-Chun Lin and Shih-Ying Liu and Hung-Ming Chen},
  journal={2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)},
The issue on reliability of the device becomes more critical as power density of device progressively increases with advancement of technology nodes. Smaller transistor and hence thinner gate oxide implies transistors are more vulnerable against an Electrostatic Discharge (ESD) event. Among the test models in ESD, Charged Device Model (CDM) has greater potential to cause catastrophic damage to the device due to its faster and larger discharging current. To protect against a CDM event, power… CONTINUE READING