Picometre-precision analysis of scanning transmission electron microscopy images of platinum nanocatalysts.

  title={Picometre-precision analysis of scanning transmission electron microscopy images of platinum nanocatalysts.},
  author={Andrew B. Yankovich and Benjamin Berkels and Wolfgang Dahmen and Peter Binev and Sergio I. Sanchez and Steven A. Bradley and Ao Li and Izabela Szlufarska and Paul M. Voyles},
  journal={Nature communications},
Measuring picometre-scale shifts in the positions of individual atoms in materials provides new insight into the structure of surfaces, defects and interfaces that influence a broad variety of materials' behaviour. Here we demonstrate sub-picometre precision measurements of atom positions in aberration-corrected Z-contrast scanning transmission electron microscopy images based on the non-rigid registration and averaging of an image series. Non-rigid registration achieves five to seven times… 
High-precision scanning transmission electron microscopy at coarse pixel sampling for reduced electron dose
Determining the precise atomic structure of materials’ surfaces, defects, and interfaces is important to help provide the connection between structure and important materials’ properties. Modern
Lattice Strain Measurement of Core@Shell Electrocatalysts with 4D Scanning Transmission Electron Microscopy Nanobeam Electron Diffraction
Strain engineering enables the direct modification of the atomic bonding and is currently an active area of research aimed at improving the electrocatalytic activity. However, directly measuring the
Quantitative Electron Microscopy Studies of Metal Nanoparticle Catalysts: Nanostructure, Support Interaction and Ageing Effects
Heterogeneous catalysis plays a major role in modern society, for example in chemical production, sustainable energy production and emission control technologies. Metal nanoparticles (NPs) supported
Direct Observation of Sr Vacancies in SrTiO 3 by Quantitative Scanning Transmission Electron Microscopy
Unveiling the identity, spatial configuration, and microscopic structure of point defects is one of the key challenges in materials science. Here, we demonstrate that quantitative scanning
Subpercent Local Strains Due to the Shapes of Gold Nanorods Revealed by Data-Driven Analysis.
An advanced data-driven analysis method, Gaussian process regression, is utilized to predict the true strain distribution by reconstructing the true atomic positions and indicates that the strain distribution depends on the shape of the nanomaterials.
Increased Fluctuation of Interatomic Distances in Distorted Structure of Stoichiometric LaMnO3
Non-rigid registration of aberrationcorrected scanning transmission electron microscope (STEM) images enables sub-picometer precision in locating atomic column positions under favorable circumstances
Probing Multiscale Disorder in Pyrochlore and Related Complex Oxides in the Transmission Electron Microscope: A Review
Transmission electron microscopy (TEM), and its counterpart, scanning TEM (STEM), are powerful materials characterization tools capable of probing crystal structure, composition, charge distribution,
Approaches to Exploring Spatio-Temporal Surface Dynamics in Nanoparticles with In Situ Transmission Electron Microscopy
This work quantitatively characterizes beam-induced dynamic structural rearrangements taking place on the surface of CeO2 (ceria) using a 2D Gaussian fitting procedure, which will provide new insights into the behavior of nanoparticle surface reconstructions that were previously inaccessible using other methods.
Shape-dependent local strain in gold nanorods: data-driven atomic-resolution electron microscopy analysis
The local variation in inter-atomic distances, or local lattice strain often influences significantly material properties of nanoparticles. Strain measurement with ~1% precision is provided by recent


Direct Imaging of the Atomic Configuration of Ultradispersed Catalysts
Direct imaging of individual catalyst metal atoms on the insulating surface of an industrial support is demonstrated. Individual platinum and rhodium atoms ultradispersed on γ-Al2O3 supports were
Statistical estimation of atomic positions from exit wave reconstruction with a precision in the picometer range.
The local structure of Bi4W2/3Mn1/3O8Cl is determined using quantitative transmission electron microscopy to refine all atomic positions on a local scale, including those of the light atoms, with a precision in the picometer range.
X-ray studies of defects and thermal vibrations in an organometallic vapor phase epitaxy grown GaN thin film
A semiconducting GaN thin film with the 001 plane parallel to the surface grown by organometallic vapor phase epitaxy method on (110) sapphire was studied using x-ray diffraction. The line profiles
Atomic-scale study of electric dipoles near charged and uncharged domain walls in ferroelectric films.
Using the negative spherical-aberration imaging technique in an aberration-corrected transmission electron microscope, a large difference in atomic details between charged and uncharged domain walls is reported.
Quantitative atomic resolution scanning transmission electron microscopy.
It is shown that intensity variations can be placed on an absolute scale by normalizing the measured image intensities to the incident beam using fractional intensity images of a SrTiO3 single crystal for regions of different thickness up to 120 nm.
Experimental studies of small particle structures
Data on the experimental structure of small particles is reviewed, the emphasis being an attempt to correlate experimental information with theoretical models. First, a general discussion of some of