Picometre-precision analysis of scanning transmission electron microscopy images of platinum nanocatalysts.

@article{Yankovich2014PicometreprecisionAO,
  title={Picometre-precision analysis of scanning transmission electron microscopy images of platinum nanocatalysts.},
  author={Andrew B. Yankovich and Benjamin Berkels and Wolfgang Dahmen and Peter Binev and Sergio I. Sanchez and Steven A. Bradley and Ao Li and Izabela Szlufarska and Paul M. Voyles},
  journal={Nature communications},
  year={2014},
  volume={5},
  pages={
          4155
        }
}
Measuring picometre-scale shifts in the positions of individual atoms in materials provides new insight into the structure of surfaces, defects and interfaces that influence a broad variety of materials' behaviour. Here we demonstrate sub-picometre precision measurements of atom positions in aberration-corrected Z-contrast scanning transmission electron microscopy images based on the non-rigid registration and averaging of an image series. Non-rigid registration achieves five to seven times… 
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