Physical Versus Logical Fault Models MOS LSI Circuits: Impact on Their Testability

@article{Galiay1980PhysicalVL,
  title={Physical Versus Logical Fault Models MOS LSI Circuits: Impact on Their Testability},
  author={J. Galiay and Yves Crouzet and M. Vergniault},
  journal={IEEE Transactions on Computers},
  year={1980},
  volume={C-29},
  pages={527-531}
}
At the end of an IC production line, integrated circuits are generally submitted to three kinds of tests: 1) parametric tests to check electrical characteristics (voltage, current, power consumption), 2) dynamic tests to check response times under nominal operating conditions, and 3) functional tests to check its logical behavior. 
Highly Cited
This paper has 112 citations. REVIEW CITATIONS

From This Paper

Figures, tables, and topics from this paper.

Citations

Publications citing this paper.
Showing 1-10 of 61 extracted citations

Design and Application of Self-Testing Comparators Implemented with MOS PLA's

IEEE Transactions on Computers • 1984
View 5 Excerpts
Highly Influenced

Design-for-Testability Techniques for Arithmetic Circuits

2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis • 2009
View 1 Excerpt

Switch-Level Test Calculation for CMOS Circuits

2009 10th International Workshop on Microprocessor Test and Verification • 2009

Transistor-level test calculation for CMOS circuits

2009 IEEE International Conference on Computational Cybernetics (ICCC) • 2009

113 Citations

051015'80'90'01'12
Citations per Year
Semantic Scholar estimates that this publication has 113 citations based on the available data.

See our FAQ for additional information.

References

Publications referenced by this paper.
Showing 1-5 of 5 references

Optimal detection of bridging faults and stuckatfaults , in two - level logic

M. G. Karpovsky, E. S. Moskalev, S. Y. H. Su, P. R. Menon
IEEE Trans . Comput . • 1978

Bridging and stuckatfaults

D. K. Pradhan
1974

Definition and design of easily testable or selftesting LSI circuits " ( in French ) , Contract Rep

J. Galiay Y. Crouzet, C. Landrault, P. Rousseau, M. Vergniault
-1

Similar Papers

Loading similar papers…