• DOI:10.1063/1.4863664
• Corpus ID: 55440436

Phase-slip lines as a resistance mechanism in transition-edge sensors

@article{Bennett2014PhaseslipLA,
  title={Phase-slip lines as a resistance mechanism in transition-edge sensors},
  author={Douglas A. Bennett and Daniel R. Schmidt and Daniel S Swetz and J. N. Ullom},
  journal={Applied Physics Letters},
  year={2014},
  volume={104},
  pages={042602}
}

• D. Bennett, D. Schmidt, +1 author J. Ullom
• Published 27 January 2014
• Physics
• Applied Physics Letters

The fundamental mechanism of resistance in voltage-biased superconducting films is poorly understood despite its importance as the basis of transition-edge sensors (TESs). TESs are utilized in state-of-the-art microbolometers and microcalorimeters covering a wide range of energies and applications. We present a model for the resistance of a TES based on phase-slip lines (PSLs) and compare the model to data. One of the model's predictions, discrete changes in the number of PSLs, is a possible explanation for the observed switching between discrete current states in localized regions of bias.