Phase shifting thin film multilayers for Michelson interferometers.

Abstract

The design and construction of a set of four high reflectance metal-dielectric thin film multilayers which produce phase changes on reflection that differ by 90 degrees in the 0.55-0.77-microm spectral range are described. This provides the basis for a new type of optical Doppler Michelson imaging interferometer for use in upper atmospheric studies in which… (More)
DOI: 10.1364/AO.28.002854

Topics

  • Presentations referencing similar topics