Phase-sensitive silicon-based total internal reflection sensor.

@article{Patskovsky2007PhasesensitiveST,
  title={Phase-sensitive silicon-based total internal reflection sensor.},
  author={Sergiy Patskovsky and Michel Meunier and Andrei V Kabashin},
  journal={Optics express},
  year={2007},
  volume={15 19},
  pages={12523-8}
}
A concept of phase-sensitive Si-based Total Internal Reflection bio- and chemical sensor is presented. The sensor uses the reflection of light from an internal edge of a Si prism, which is in contact with analyte material changing its index of refraction (thickness). Changes of the refractive index are monitored by measuring the differential phase shift between p- and s-polarized components of light reflected from the system. We show that due to a high refractive index of Si, such methodology… CONTINUE READING