Phase noise analysis for ICI self-cancellation coded OFDM with short-channel synchronization devices

@article{Herlekar2005PhaseNA,
  title={Phase noise analysis for ICI self-cancellation coded OFDM with short-channel synchronization devices},
  author={Sameer R. Herlekar and Hsiao-Chun Wu and Chi Zhang and Ashok Srivastava},
  journal={GLOBECOM '05. IEEE Global Telecommunications Conference, 2005.},
  year={2005},
  volume={1},
  pages={5 pp.-}
}
Phase noise is the major cause of performance degradation in OFDM systems. Hot carriers (HCs), found in the CMOS-based synchronization circuits, are high-mobility charge carriers that affect the MOSFETs' stability by increasing the required operating threshold voltages. The HC effect manifests itself as the phase noise, which increases with the continued MOSFET operation and results in the performance degradation of the voltage-controlled oscillator (VCO) built on the MOSFETs. The MOSFET… CONTINUE READING

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