Phase-contrast tomography at the nanoscale using hard x rays

@inproceedings{Stampanoni2010PhasecontrastTA,
  title={Phase-contrast tomography at the nanoscale using hard x rays},
  author={Marco Stampanoni and Rajmund Mokso and Federica Marone and Joan Vila-Comamala and Sergey Gorelick and Pavel Trtik and K. Jefimovs and Christian David},
  year={2010}
}
Synchrotron-based full-field tomographic microscopy established itself as a tool for noninvasive investigations. Many beamlines worldwide routinely achieve micrometer spatial resolution while the isotropic 100-nm barrier is reached and trespassed only by few instruments, mainly in the soft x-ray regime. We present an x-ray, full-field microscope with tomographic capabilities operating at 10 keV and with an isotropic resolution of 144 nm. Custom-designed optical components allow for ideal… CONTINUE READING

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