Periodic Artifact Reduction in Fourier Transforms of Full Field Atomic Resolution Images

@article{Hovden2015PeriodicAR,
  title={Periodic Artifact Reduction in Fourier Transforms of Full Field Atomic Resolution Images},
  author={Robert Hovden and Yi Jiang and Huolin L. Xin and Lena F. Kourkoutis},
  journal={Microscopy and Microanalysis},
  year={2015},
  volume={21},
  pages={436 - 441}
}
Abstract The discrete Fourier transform is among the most routine tools used in high-resolution scanning/transmission electron microscopy (S/TEM). However, when calculating a Fourier transform, periodic boundary conditions are imposed and sharp discontinuities between the edges of an image cause a cross patterned artifact along the reciprocal space axes. This artifact can interfere with the analysis of reciprocal lattice peaks of an atomic resolution image. Here we demonstrate that the recently… 
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