Performance of ultrathin alternative diffusion barrier metals for next - Generation BEOL technologies, and their effects on reliability

In order to maximize Cu volume and reduce via resistance, barrier thickness reduction is a strong option. Alternative barriers for next-generation BEOL were evaluated in terms of barrier performance to O2 and Cu diffusion, and effects on reliability. A clear correlation of O2 barrier performance to electromigration was observed, suggesting that the key role… (More)