Perfect X-ray focusing via fitting corrective glasses to aberrated optics


Due to their short wavelength, X-rays can in principle be focused down to a few nanometres and below. At the same time, it is this short wavelength that puts stringent requirements on X-ray optics and their metrology. Both are limited by today's technology. In this work, we present accurate at wavelength measurements of residual aberrations of a refractive X-ray lens using ptychography to manufacture a corrective phase plate. Together with the fitted phase plate the optics shows diffraction-limited performance, generating a nearly Gaussian beam profile with a Strehl ratio above 0.8. This scheme can be applied to any other focusing optics, thus solving the X-ray optical problem at synchrotron radiation sources and X-ray free-electron lasers.

DOI: 10.1038/ncomms14623

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@inproceedings{Seiboth2017PerfectXF, title={Perfect X-ray focusing via fitting corrective glasses to aberrated optics}, author={Frank Seiboth and Andreas Schropp and Maria Scholz and Felix Wittwer and Christian R{\"{o}del and Martin W{\"{u}nsche and Tobias Ullsperger and Stefan Nolte and Jussi Rahom{\"a}ki and Karolis Parfeniukas and Stylianos Giakoumidis and Ulrich F Vogt and Ulrich H. Wagner and Christoph Rau and Ulrike Boesenberg and Jan Garrevoet and Gerald Falkenberg and Eric Ch Galtier and Hae Ja Lee and Bob Nagler and Christian G Schroer}, booktitle={Nature communications}, year={2017} }