Pattern selection for testing of deep sub-micron timing defects

@article{Chao2004PatternSF,
  title={Pattern selection for testing of deep sub-micron timing defects},
  author={Mango Chia-Tso Chao and Li-C. Wang and Kwang-Ting Cheng},
  journal={Proceedings Design, Automation and Test in Europe Conference and Exhibition},
  year={2004},
  volume={2},
  pages={1060-1065 Vol.2}
}
Due to process variations in deep sub-micron (DSM) technologies, the effects of timing defects are difficult to capture. This paper presents a novel coverage metric for estimating the test quality with respect to timing defects under process variations. Based on the proposed metric and a dynamic timing analyzer, we develop a pattern-selection algorithm for selecting the minimal number of patterns that can achieve the maximal test quality. To shorten the runtime in dynamic timing analysis, we… CONTINUE READING
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Path Selection and Pattern Generation for Dynamic Timing Analysis considering power supply noise effects

J.-J. Liou, A. Krstic, Y.-M. Jiang, K.-T. Cheng
ACM/IEEE International Conference on Computer Aided Design, • 2000
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