Pattern classification using principal components of cortical thickness and its discriminative pattern in schizophrenia

@article{Yoon2007PatternCU,
  title={Pattern classification using principal components of cortical thickness and its discriminative pattern in schizophrenia},
  author={Uicheul Yoon and Jong-Min Lee and Kiho Im and Yong-Wook Shin and Baek Hwan Cho and In-Young Kim and Jun Soo Kwon and Sun Il Kim},
  journal={NeuroImage},
  year={2007},
  volume={34},
  pages={1405-1415}
}
We proposed pattern classification based on principal components of cortical thickness between schizophrenic patients and healthy controls, which was trained using a leave-one-out cross-validation. The cortical thickness was measured by calculating the Euclidean distance between linked vertices on the inner and outer cortical surfaces. Principal component analysis was applied to each lobe for practical computational issues and stability of principal components. And, discriminative patterns… CONTINUE READING

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