Partition noise in CCD signal detection

  title={Partition noise in CCD signal detection},
  author={Nozomu Teranishi and Naoki Mutoh},
  journal={1985 International Electron Devices Meeting},
Reset noise in CCD signal charge detection has been analyzed experimentally and theoretically. From the reset noise measurement experiment, it has been inferred that reset noise consists of sensing capacitance Cs dependent part and effective reset channel length L dependent part. Conventional reset noise theory, where the Johnson noise in reset MOS channel was regarded as the only reset noise source, agrees with the Cs dependent part of measured reset noise. However, it cannot explain the L… CONTINUE READING
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Characterization of Surface Channel CCD Image Arrays at Low Light Levels

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Noise Sources in Charge Coupled Devices

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