Partial Scan Selection Based on Dynamic Reachability and Observability Information

Abstract

A partial scan selection strategy is proposed in which flip-flops are selected via newly proposed dynamic reachability and observability measures such that the remaining hard-to-detect faults are easily detected. This is done by taking advantage of the information available when a target fault is aborted by the test generator. A partial scan selection tool… (More)
DOI: 10.1109/ICVD.1998.646598

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