Parity-Scan Design to Reduce the Cost of Test Application

@inproceedings{Fujiwara1992ParityScanDT,
  title={Parity-Scan Design to Reduce the Cost of Test Application},
  author={Hideo Fujiwara and Akihiro Yamamoto},
  booktitle={ITC},
  year={1992}
}
A bsn-act: The cost of testing consists mainly of the cost of test generation and the cost of test application. Scan design approach is a representative of those techniques that can reduce the cost of test generation for sequential circuits. However, the length of a test sequence for the scan design approach can grow quite large due to the scan operation shifting the values into the scan chain, which makes the cost of test application large. This paper proposes a design-for-testability approach… CONTINUE READING