P1149.4-Problem or Solution for Mixed-Signal IC Design?

Abstract

Almost any new circuitry which falls under the category Design For Testability (DFT) is perceived by designers as a problem to be endured to make someone else’s job easier, i.e. that of the manufacturing engineer. After all, no net benefit is gained by simply transferring problems from manufacturing into design. Even if there is a net benefit, the designer… (More)
DOI: 10.1109/TEST.1997.639671

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Cite this paper

@inproceedings{Sunter1997P11494ProblemOS, title={P1149.4-Problem or Solution for Mixed-Signal IC Design?}, author={Stephen K. Sunter}, booktitle={ITC}, year={1997} }