P R O C SrTiO 3 ( 001 ) Substrate Preparation and Characterization CNF

Abstract

We utilize atomic force microscopy (AFM) to characterize single crystal SrTiO3 (001) substrates before depositing heteroepitaxial thin films of complex oxides. Only those substrates with straight, single unit cell high steps separating large, atomically smooth terraces produce high quality thin films. Summary of Research: SrTiO3 has become a widely used… (More)

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Cite this paper

@inproceedings{Brock2008PRO, title={P R O C SrTiO 3 ( 001 ) Substrate Preparation and Characterization CNF}, author={J. D. Brock and G{\"o}khan Arikan}, year={2008} }