Corpus ID: 215822346

Overview of the 6th International Competition on Plagiarism Detection

  title={Overview of the 6th International Competition on Plagiarism Detection},
  author={Martin Potthast and Matthias Hagen and Tim Gollub and M. Tippmann and Johannes Kiesel and P. Rosso and E. Stamatatos and B. Stein},
  • Martin Potthast, Matthias Hagen, +5 authors B. Stein
  • Published in CLEF 2014
  • Computer Science
  • Thispaper overviews 18 plagiarism detectors that have been developed and evaluated within PAN'10. We start with a unified retrieval process that sum- marizes the best practices employed this year. Then, the detectors' performances are evaluated in detail, highlighting several important aspects of plagiarism de- tection, such as obfuscation, intrinsic vs. external plagiarism, and plagiarism case length. Finally, all results are compared to those of last year's competition. 
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