Output bit selection for test response compaction based on a single counter

Abstract

Recently a novel test response compaction method called output bit selection, or simply output selection, is proposed. By observing only a subset of output responses, this method can effectively deal with the aliasing, unknown-value, and low-diagnosis problems. One important issue for output selection is how to implement the selection hardware to obtain a… (More)

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Cite this paper

@article{Lee2012OutputBS, title={Output bit selection for test response compaction based on a single counter}, author={Kuen-Jong Lee and Wei-Cheng Lien and Tong-Yu Hsieh}, journal={2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology}, year={2012}, pages={1-4} }