Orientation Imaging Microscopy With Optimized Convergence Angle Using CBED Patterns in TEMs

@article{Kumar2013OrientationIM,
  title={Orientation Imaging Microscopy With Optimized Convergence Angle Using CBED Patterns in TEMs},
  author={Vineet Kumar},
  journal={IEEE Transactions on Image Processing},
  year={2013},
  volume={22},
  pages={2637-2645}
}
Grain size statistics, texture, and grain boundary distribution are microstructural characteristics that greatly influence materials properties. These characteristics can be derived from an orientation map obtained using orientation imaging microscopy (OIM) techniques. The OIM techniques are generally performed using a transmission electron microscopy (TEM… CONTINUE READING