Optimization of a cycle time and utilization in semiconductor test manufacturing using simulation based, on-line, near-real-time scheduling system

Abstract

A discrete event simulation based “on-line near-real-time” dynamic scheduling and optimization system has been conceptualized, designed, and developed to optimize cycle time and asset utilization in the complex manufacturing environment of semiconductor test manufacturing. Our approach includes the application of rules and optimization algorithm, using… (More)
DOI: 10.1145/324138.324467

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