Optimal sampling and reconstruction of undersampled atomic force microscope images using compressive sensing.

Abstract

Atomic force microscope (AFM) is an analytical instrument which is used to study the surface structure and morphology of materials. The AFM can measure and observe samples either in air or liquid environment. However, the standard AFM requires a long time to acquire accurate images and data. In our work, the compressive sensing (CS) was applied in order to… (More)
DOI: 10.1016/j.ultramic.2018.03.019

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