Optical nano artifact metrics using silicon random nanostructures

  title={Optical nano artifact metrics using silicon random nanostructures},
  author={Tsutomu Matsumoto and Naoki Yoshida and Shumpei Nishio and Morihisa Hoga and Yasuyuki Ohyagi and Naoya Tate and Makoto Naruse},
  journal={Scientific Reports},
Nano-artifact metrics exploit unique physical attributes of nanostructured matter for authentication and clone resistance, which is vitally important in the age of Internet-of-Things where securing identities is critical. However, expensive and huge experimental apparatuses, such as scanning electron microscopy, have been required in the former studies. Herein, we demonstrate an optical approach to characterise the nanoscale-precision signatures of silicon random structures towards realising… 
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