Optical differential reflectance spectroscopy of ultrathin epitaxial organic films.

@article{Forker2009OpticalDR,
  title={Optical differential reflectance spectroscopy of ultrathin epitaxial organic films.},
  author={Roman Forker and Torsten Fritz},
  journal={Physical chemistry chemical physics : PCCP},
  year={2009},
  volume={11 13},
  pages={
          2142-55
        }
}
  • R. Forker, T. Fritz
  • Published 18 March 2009
  • Physics
  • Physical chemistry chemical physics : PCCP
This Perspective does not have the ambition to entirely review the subject of optical spectroscopy on thin organic films. What we will try to achieve instead is to give an overview on optical reflectance spectroscopy of highly ordered organic thin films in the thickness range from submonolayers to several monolayers, as a tool to study the absorption behavior of such films. By doing so, we will emphasize the relations between the physical layer structure and the resulting optical properties… 
View on PubMed
uv.es
81 Citations
Background Citations
5
Methods Citations
2

81 Citations

Citation Type

Citation Type

In-situ, Real-Time Investigation of Organic Thin Film Growth Using Reflectance Difference Spectroscopy
We review our recent work on the in-situ studies of organic thin films in ultra high vacuum (UHV) using reflectance difference spectroscopy (RDS). By monitoring in real time the evolution of the…
Polarization-dependent differential reflectance spectroscopy for real-time monitoring of organic thin film growth.
TLDR
This work implements polarization-dependent DRS to monitor the growth of perflouropentacene thin films on a Ag(110) single crystal and deduces the optical anisotropy of the sample and, in particular, the preferred orientation of the molecules on the surface.
Layer-Resolved Evolution of Organic Thin Films Monitored by Photoelectron Emission Microscopy and Optical Reflectance Spectroscopy
TLDR
It is illustrated how the combined PEEM and DRS results can be correlated to obtain an extended perspective on the electronic and optical properties of a molecular film dependent on the film thickness and morphology.
Optical differential reflectance spectroscopy on thin molecular films
Optical spectroscopy is a powerful tool to study in depth manifold physical processes occurring in molecular solids, at interfaces between molecules and substrates, and at interfaces between…
Reflectance anisotropy spectroscopy: A probe to explore organic epitaxial growth
Reflectance anisotropy spectroscopy (RAS) is demonstrated to be particularly suitable for studying the deposition of organic epitaxial layers in ultrahigh vacuum by organic molecular beam epitaxy,…
Optical differential reflectance spectroscopy for photochromic molecules on solid surfaces.
TLDR
An experimental setup is presented that is capable of high-quality measurements of submonolayers and ultrathin layers of photochromic molecules on surfaces as well as quantifying their isomerization kinetics and characterization of the photoswitching and thermal switching of a spirooxazine derivate on a bismuth surface.
Fluorescence spectroscopy of ultrathin molecular organic films on surfaces
We review our recent experiments by linear optical spectroscopy in the visible spectral range on interface controlled monolayers and thin films of π-conjugated organic molecules on well-defined…
A Surface Scientist’s View on Spectroscopic Ellipsometry
Nowadays, a broad choice of instruments, including dedicated synchrotron radiation beamlines, allows to exploit Spectroscopic Ellipsometry (SE) to investigate the thickness and the dielectric…
Real-time monitoring of 2D semiconductor film growth with optical spectroscopy.
TLDR
The first real time in situ optical spectroscopic study on the molecular beam epitaxy of atomically thin molybdenum diselenide (MoSe2) films on sapphire substrates using differential reflectance spectroscopy is reported.
Growth oscillation of MoSe2 monolayers observed by differential reflectance spectroscopy.
The precisely controlled growth of transition metal dichalcogenide (TMDC) monolayers requires sensitive and nondestructive techniques to monitor the morphology and coverage in-situ and in real time.…
...
1
2
3
4
5
...

References

SHOWING 1-10 OF 139 REFERENCES
In situ differential reflectance spectroscopy of thin crystalline films of PTCDA on different substrates
We report an investigation of the excitonic properties of thin crystalline films of the archetypal organic semiconductor PTCDA (3,4,9,10-perylenetetracarboxylic dianhydride) grown on poly- and single…
Growth‐Mode‐Induced Narrowing of Optical Spectra of an Organic Adlayer
Devices based on organic semiconductors allow novel applications, stimulating intensive research on the physicochemical characteristics of organic thin films. With true molecular electronics at the…
The application of reflectance anisotropy spectroscopy to organics deposition
In situ optical investigation of oligothiophene layers grown by organic molecular beam epitaxy : Linear optics at surfaces and interfaces
Reflectance anisotropy spectroscopy (RAS) has recently been used to monitor in situ and in real time the growth of thin organic layers in ultra high vacuum (UHV) (Goletti et al 2003 Appl. Phys. Lett,…
Optical anisotropy of organic layers on GaAs(001)
The application of the linear-optical, polarization sensitive methods, in situ reflectance anisotropy spectroscopy (RAS), and ex situ spectroscopic ellipsometry, for the characterization of organic…
Online measurement of the optical anisotropy during the growth of crystalline organic films
We report a reflectance difference spectroscopy (RDS) investigation of the growth of para-sexiphenyl (p-6P) on a TiO2(110) single crystal substrate at 100, 300, and 400K. The results demonstrate that…
Highly sensitive optical monitoring of molecular film growth by organic molecular beam deposition
Reflectance anisotropy spectroscopy (RAS) has been employed to study in situ the growth of thin α-sexithiophene films by organic molecular beam deposition onto an organic substrate. A large…
Optical anisotropy and gas sensing properties of ordered porphyrin films
Ordered films of porphyrins are routinely obtained by Langmuir-Blodgett technique, with a thickness control at the level of a single monolayer. The study of their optical anisotropy by reflectance…
Structure, morphology, and optical properties of thin films of F16CuPc grown on silicon dioxide
Optical anisotropy of Langmuir–Blodgett sapphyrin films
The polarization dependence of the optical reflectivity for sapphyrin layers deposited by the Langmuir–Blodgett technique onto a gold substrate has been measured. The experimental results show that…
...
1
2
3
4
5
...