Optical detection system for probing cantilever deflections parallel to a sample surface.

@article{Labuda2011OpticalDS,
  title={Optical detection system for probing cantilever deflections parallel to a sample surface.},
  author={Aleksander Labuda and Tiberius Brastaviceanu and Ihor Pavlov and Wolfgang Paul and Dilson E Rassier},
  journal={The Review of scientific instruments},
  year={2011},
  volume={82 1},
  pages={013701}
}
To date, commercial atomic force microscopes have been optimized for measurements of forces perpendicular to the sample surface. In many applications, sensitive parallel force measurements are desirable. These can be obtained by positioning the cantilever with its long axis perpendicular to the sample: the so-called pendulum geometry. We present a compact optical beam deflection system which solves the geometrical constraint problems involved in focusing a light beam onto a cantilever in the… CONTINUE READING

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