Online Test Technology for Reversible Circuits

  title={Online Test Technology for Reversible Circuits},
  author={Jing Ling Hu and Dian Zhong Wen},
A new technique is presented for online test with some garbage lines in reversible circuits. Firstly, testable structures for reversible logic are given. Then, a scan-D Flip-Flops for constructing scan-chains is provided. Using the new scan-D Flip-Flops, test programs for reversible circuits were analyzed. The proposed method was tested on a set of reversible benchmarks. It realized online test.