On-wafer measurement of the reverse-recovery time of integrated diodes by Transmission-Line-Pulsing (TLP)


0026-2714/$ see front matter 2011 Elsevier Ltd. A doi:10.1016/j.microrel.2011.02.012 ⇑ Corresponding author. E-mail address: martin.sauter@unibw.de (M. Saute We present a new method for the on-wafer-characterisation for the reverse recovery behaviour of integrated diodes, which can perform on-wafer automated measurements over a wide range of different bias… (More)
DOI: 10.1016/j.microrel.2011.02.012

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