On using test vector differences for reducing test pin numbers

@article{Flottes2004OnUT,
  title={On using test vector differences for reducing test pin numbers},
  author={Marie-Lise Flottes and Regis Poirier and Bruno Rouzeyre},
  journal={Proceedings. DELTA 2004. Second IEEE International Workshop on Electronic Design, Test and Applications},
  year={2004},
  pages={275-280}
}
We propose a method for reducing test data volume on System on Chip (SoC) architecture. This method reduces the required number of Automatic Test Equipment (ATE) output pins compared to the number of scan-in inputs on every core (horizontal compression). Compression and decompression are based on arithmetic operations and operators. 
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