On the testability of array structures for FFT computation

  title={On the testability of array structures for FFT computation},
  author={Chao Feng and Jon C. Muzio and Fabrizio Lombardi},
  journal={J. Electronic Testing},
This article presents new approaches for testing VLSI array architectures used in the computation of the complex N-point Fast Fourier Transform. Initially, an unrestricted single cell-level fault model is considered. The first proposed approach is based on a process whose complexity is independent (or Cas constant) of the number of cells in the FFT architecture. This is accomplished by showing a topological equivalence between the FFT array and a linear (one-dimensional) array. The process of… CONTINUE READING


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