On the reliability of symmetrical CMOS OTA operating in subthreshold region

@article{Ozcelep2006OnTR,
  title={On the reliability of symmetrical CMOS OTA operating in subthreshold region},
  author={Yasin Ozcelep and Ayten Kuntman and Hakan Kuntman},
  journal={MELECON 2006 - 2006 IEEE Mediterranean Electrotechnical Conference},
  year={2006},
  pages={191-194}
}
CMOS circuits such as OTAs (operational transconductance amplifiers) operating in the subthreshold (weak inversion) region introduce a versatile solution for the realization of low-power VLSI building blocks. In this paper, hot carrier induced degradation of electrical parameters of CMOS OTAs operating in subthreshold region is investigated by accelerated laboratory measurements. Using the experimental observations a degradation model is proposed for reliability of CMOS OTA. The advantages… CONTINUE READING
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