On the power dependence of extraneous microwave fields in atomic frequency standards

@article{Jefferts2005OnTP,
  title={On the power dependence of extraneous microwave fields in atomic frequency standards},
  author={S. R. Jefferts and J. H. Shirley and Neil Ashby and T. P. Heavner and E. A. Donley and Francis L{\'e}vi},
  journal={Proceedings of the 2005 IEEE International Frequency Control Symposium and Exposition, 2005.},
  year={2005},
  pages={6 pp.-}
}
We show that the frequency bias caused by distributed cavity phase has a strong dependence on microwave power. We also show that frequency biases associated with microwave leakage have distinct signatures in their dependence on microwave power and the physical location of the leakage interaction with the atom.