On the efficacy of NBTI mitigation techniques

@article{Chan2011OnTE,
  title={On the efficacy of NBTI mitigation techniques},
  author={Tuck-Boon Chan and John Sartori and Puneet Gupta and Rakesh Kumar},
  journal={2011 Design, Automation & Test in Europe},
  year={2011},
  pages={1-6}
}
Negative Bias Temperature Instability (NBTI) has become an important reliability issue in modern semiconductor processes. Recent work has attempted to address NBTI-induced degradation at the architecture level. However, such work has relied on device-level analytical models that, we argue, are limited in their flexibility to model the impact of architecture-level techniques on NBTI degradation. In this paper, we propose a flexible numerical model for NBTI degradation that can be adapted to… CONTINUE READING
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